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The higher resiliency of Flash-based FPGAs to Single Event Upsets (SEUs) with respect to other non radiation-hardened devices, such as SRAM-based FPGAs, are increasing more and more their demand for avionic and space applications, where a harsh environment rich in ionizing radiation has to be faced. In this type of devices other transient faults tend to dominate over SEUs, especially when the device...
SRAM-based Field Programmable Gate Arrays (FPGAs) are becoming more and more popular among aerospace devices. Radiation effects have to be investigated in order to measure the fault tolerance degree of the applications and to validate new mitigation techniques. Fault injection is one of the possible evaluation methods. Several platforms have been developed in the past years in order to inject soft...
We present an experimental analysis of alpha-induced soft errors in 90-nm low-end SRAM-based FPGAs. We first assess the relative sensitivity of the configuration memory bits controlling the different resources in the FPGA. We then study how SEU accumulation in the configuration memory impacts on the reliability of unhardened and hardened-by-design circuits. We analyze different hardening solutions...
We present an experimental analysis of alpha-induced soft errors in 90-nm low-end SRAM-based FPGAs. We first assess the relative sensitivity of the configuration memory bits controlling the different resources in the FPGA. We then study how SEU accumulation in the configuration memory impacts on the reliability of unhardened and hardened-by-design circuits. We analyze different hardening solutions...
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