Search results for: Y Hayase
Microelectronics Reliability > 2015 > 55 > 9-10 > 1559-1563
IEEE Transactions on Dielectrics and Electrical Insulation > 2015 > 22 > 2 > 1240 - 1249
2012 IEEE International Reliability Physics Symposium (IRPS) > 2D.4.1 - 2D.4.5
2010 International Electron Devices Meeting > 35.3.1 - 35.3.4
IEEE Transactions on Dielectrics and Electrical Insulation > 2008 > 15 > 1 > 152 - 160