Search results for: Friedhelm Bauer
IEEE Electron Device Letters > 2017 > 38 > 8 > 1063 - 1066
Microelectronics Reliability > 2016 > 58 > C > 51-57
CAS 2012 (International Semiconductor Conference) > 1 > 27 - 36
IEEE Electron Device Letters > 2012 > 33 > 9 > 1288 - 1290
IEEE Electron Device Letters > 2011 > 32 > 9 > 1275 - 1277
Solid State Electronics > 2010 > 54 > 4 > 385-391
IEEE Electron Device Letters > 2010 > 31 > 6 > 591 - 593