Search results for: Yiran Chen
IEEE Design & Test > 2017 > 34 > 3 > 6 - 7
IEEE Transactions on Computers > 2016 > 65 > 11 > 3427 - 3440
IEEE Design & Test > 2017 > 34 > 3 > 6 - 7
IEEE Transactions on Computers > 2016 > 65 > 11 > 3427 - 3440