Search results for: Yiran Chen
IEEE Design & Test > 2017 > 34 > 3 > 8 - 22
IEEE Design & Test > 2017 > 34 > 3 > 6 - 7
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 12 > 2008 - 2017
IEEE Design & Test > 2017 > 34 > 3 > 8 - 22
IEEE Design & Test > 2017 > 34 > 3 > 6 - 7
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 12 > 2008 - 2017