The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
This paper presents an overview over different areas where FACTS devices can improve transmission system efficiency especially under the condition of liberalized electricity markets. Furthermore, a network example, is shown where the installation of Thyristor Controlled Series Capacitor (TCSC) increases the transfer capacity into a region considerably while maintaining security margins. This can help...
Sources and pathways for aluminium contamination in a high current ion implanter are studied by a set of experiments. Changes to implanter disk and beamline, the intentional introduction of tracer contaminants, and TRIM models of sputtered atom distributions in angle and energy are used to draw conclusions about mechanisms transporting aluminium to the wafer surface.
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.