Search results for: N.A. Touba
2006 IEEE Autotestcon > 253 - 259
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2006 > 14 > 6 > 587 - 595
IEEE Design & Test of Computers > 2006 > 23 > 4 > 294 - 303
IEEE Autotestcon, 2005. > 759 - 765