Search results for: L. Dilillo
Microelectronics Reliability > 2017 > 76-77 > C > 644-649
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 427 - 433
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2673 - 2678
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2620 - 2626