Search results for: P. Xu
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 72 - 78
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 244 - 247
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 72 - 78
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 244 - 247