Search results for: P. Heino
Microelectronics Reliability > 2010 > 50 > 2 > 217-219
The European Physical Journal B > 2007 > 60 > 2 > 171-179
Microelectronics Journal > 2003 > 34 > 9 > 773-777
Microelectronics Reliability > 2003 > 43 > 4 > 645-650
Microelectronics Reliability > 2002 > 42 > 3 > 399-406
Computational Materials Science > 2001 > 20 > 2 > 157-167
Microelectronics Reliability > 2000 > 40 > 3 > 435-441
Safety Science > 1998 > 30 > 1-2 > 71-77
Fuel and Energy Abstracts > 1997 > 38 > 4 > 252
Journal of Molecular Liquids > 1997 > 71 > 2-3 > 225-233
Ophthalmic Literature > 1996 > 49 > 2 > 140
Chemosphere > 1996 > 32 > 2 > 391-403