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The National Institute of Standards and Technology (NIST) has recently introduced a new method for the verification of Vector Network Analyzers (VNAs). The technique is based on the new electronic calibration units that are available from several manufacturers. Using data obtained from different states of the electronic calibration unit, the user can compare their measurements against those of NIST...
We present measurements demonstrating that electronic calibration units are stable enough to be used in place of mechanical vector-network-analyzer verification artifacts. This enables a new fully automated approach to verifying microwave vector-network-analyzer calibrations with a single computer-controlled electronic verification artifact. The new system presents verification results in easy-to-understand...
The National Institute of Standards and Technology (NIST) recently introduced a new electronic approach for verifying microwave vector- network-analyzer (VNA) calibrations with a single computer-controlled electronic verification artifact. The verification results are captured in easy-to-understand performance metrics that, unlike those derived from measurements of mechanical verification artifacts,...
We present a technique for accurate wideband measurements of one-port devices with extreme impedances. Our technique uses a reflectometer with variable parameters (states) to obtain redundant measurements of the extreme impedance device. We process these measurements using statistical techniques that allow us to exploit the redundancy in order to increase the measurement bandwidth and reduce the measurement...
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