Search results for: L. Larcher
IEEE Electron Device Letters > 2009 > 30 > 8 > 882 - 884
IEEE Transactions on Electron Devices > 2008 > 55 > 1 > 343 - 349
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 1 > 97 - 104
IEEE Electron Device Letters > 2009 > 30 > 8 > 882 - 884
IEEE Transactions on Electron Devices > 2008 > 55 > 1 > 343 - 349
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 1 > 97 - 104