Search results for: F. Blaabjerg
Microelectronics Reliability > 2017 > 76-77 > C > 117-122
Microelectronics Reliability > 2017 > 76-77 > C > 522-526
Microelectronics Reliability > 2017 > 76-77 > C > 25-30
Microelectronics Reliability > 2017 > 76-77 > C > 272-276
Microelectronics Reliability > 2017 > 76-77 > C > 549-555
Microelectronics Reliability > 2017 > 76-77 > C > 485-489
Microelectronics Reliability > 2016 > 64 > C > 419-424
Microelectronics Reliability > 2016 > 64 > C > 403-408
Microelectronics Reliability > 2015 > 55 > 9-10 > 2022-2026
Microelectronics Reliability > 2015 > 55 > 9-10 > 1950-1955
Microelectronics Reliability > 2014 > 54 > 9-10 > 1655-1660
Archives of Electrical Engineering > 2014 > Vol. 63, nr 1 > 63-79
Microelectronics Reliability > 2013 > 53 > 9-11 > 1788-1792
IET Power Electronics > 2012 > 5 > 3 > 366 - 375
IET Power Electronics > 2012 > 5 > 8 > 1491 - 1499
IET Power Electronics > 2012 > 5 > 6 > 920 - 927
IET Power Electronics > 2012 > 5 > 8 > 1418 - 1429
Microelectronics Reliability > 2011 > 51 > 9-11 > 1903-1907
IEEE Transactions on Industry Applications > 2011 > 47 > 2 > 812 - 819