Search results for: F. Iannuzzo
Journal of Materials Science: Materials in Electronics > 2019 > 30 > 18 > 17040- 17045
Microelectronics Reliability > 2017 > 76-77 > C > 522-526
Microelectronics Reliability > 2017 > 76-77 > C > 25-30
Microelectronics Reliability > 2017 > 76-77 > C > 272-276
Microelectronics Reliability > 2017 > 76-77 > C > 485-489
Microelectronics Reliability > 2016 > 64 > C > 419-424
Microelectronics Reliability > 2016 > 64 > C > 403-408
Microelectronics Reliability > 2016 > 64 > C > 524-529
Microelectronics Reliability > 2015 > 55 > 9-10 > 2022-2026
Microelectronics Reliability > 2015 > 55 > 9-10 > 1496-1500
Microelectronics Reliability > 2015 > 55 > 9-10 > 1950-1955
IEEE Transactions on Nuclear Science > 2015 > 62 > 1-2 > 202 - 209
Microelectronics Reliability > 2014 > 54 > 9-10 > 2200-2206
Microelectronics Reliability > 2014 > 54 > 9-10 > 1927-1934
Microelectronics Reliability > 2013 > 53 > 9-11 > 1707-1712
Microelectronics Reliability > 2013 > 53 > 9-11 > 1481-1485
IEEE Transactions on Nuclear Science > 2013 > 60 > 5-3 > 3793 - 3801
Microelectronics Reliability > 2012 > 52 > 9-10 > 2465-2470
Microelectronics Reliability > 2012 > 52 > 9-10 > 2420-2425