The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
We have investigated the effect of electrical aging to improve emission reliability of carbon nanotube (CNT) emitter. The CNT emitters were prepared by the screen-printing of the CNT paste. The electrical aging treatment was carried out in a high vacuum chamber by applying the pulsed dc voltage. The field emission measurements and lifetime tests were performed on the CNT emitters depending on the...
64 Mb FRAM with a 1T1C scheme has progressed greatly for mass production in terms of a highly reliable device. For the first time, package-level reliabilities of the memory were evaluated systematically and massively. The authors scrutinized the device reliabilities in accelerated manners, one of which is high-temperature-operating-life (HTOL) test; and the other is high-temperature-storage (HTS)...
Fully functional 512Mb PRAM with 0.047mum2 (5.8F2) cell size was successfully fabricated using 90nm diode technology in which the authors developed novel process schemes such as vertical diode as cell switch, self-aligned bottom electrode contact scheme, and line-type Ge2Sb2Te5. The 512Mb PRAM showed excellent electrical properties of sufficiently large on-current and stable phase transition behavior...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.