Search results for: R.L. Ewing
Electronics Letters > 2013 > 49 > 18
IEEE Transactions on Image Processing > 2009 > 18 > 10 > 2340 - 2354
2007 2nd International Design and Test Workshop > 222 - 225
48th Midwest Symposium on Circuits and Systems, 2005. > 770 - 773 Vol. 1