Search results for: F. Taenzler
IEEE Design & Test of Computers > 2010 > 27 > 6 > 6 - 17
IEEE Design & Test of Computers > 2008 > 25 > 2 > 150 - 159
1993 IEEE MTT-S International Microwave Symposium Digest > 1351 - 1354 vol.3
IEEE Design & Test of Computers > 2010 > 27 > 6 > 6 - 17
IEEE Design & Test of Computers > 2008 > 25 > 2 > 150 - 159
1993 IEEE MTT-S International Microwave Symposium Digest > 1351 - 1354 vol.3