Search results for: Tai-Yuan Wu
Solid State Electronics > 2014 > 94 > Complete > 1-5
IEEE Electron Device Letters > 2014 > 35 > 2 > 202 - 204
IEEE Electron Device Letters > 2014 > 35 > 2 > 223 - 225
Microelectronic Engineering > 2013 > 105 > Complete > 40-45
2013 IEEE International Reliability Physics Symposium (IRPS) > 5E.1.1 - 5E.1.7
IEEE Design & Test of Computers > 2011 > 28 > 1 > 64 - 71
Journal of Luminescence > 2010 > 130 > 5 > 737-742
IEEE Electron Device Letters > 2010 > 31 > 12 > 1473 - 1475
IEEE Electron Device Letters > 2009 > 30 > 7 > 703 - 705
Materials Chemistry and Physics > 2008 > 112 > 1 > 115-119