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In this paper, a novel built-in tuning technique to compensate for variability induced imperfections in RF subsystems is proposed. The test stimulus is obtained from a filtered digital pattern and the RF response is down-converted using an envelope detector. The resulting signal is mapped to a digital signature, such that the Hamming Distance between the observed and the golden signature represents...
Amplitude-to-amplitude (AM-AM) and amplitude-to-phase (AM-PM) distortion are two significant effects in power amplifiers at high output power levels. Traditional measurement of amplitude and phase distortion in RF power amplifiers requires the use of expensive vector network analyzers (VNAs). This paper proposes a low cost and accurate test methodology for AM-AM and AM-PM measurement using distortion-to-amplitude...
This paper proposes a self-calibrating approach for embedded RF down-conversion mixers. In the proposed approach, the output of the RF mixer is analyzed by using on-chip resources for testing and the mixer performs self-compensation for parametric defects using tuning knobs. The tuning knobs enable the RF mixer to self-calibrate for multi-parameter variations induced due to process variability. Using...
In this paper, a novel methodology for post manufacture tuning of RF circuits is presented. The procedure uses an iterative test-tune-test algorithm that applies a compact alternative test to the DUT and modulates circuit level tuning knobs (bias/supply values) based on the DUT specification values predicted from the test. The test procedure is repeated until convergence to the desired spec values...
The recent demand in wireless standards capable of providing short-range, high-speed data transfer has accelerated the growth of the Ultra-Wide Band (UWB) standard. MB-OFDM (Multi Band Orthogonal Frequency Division Multiplexing) UWB devices suffer from frequency dependent non-idealities due to extreme wideband operation (3.1 to 10.6 GHz). Further these characteristics are subjected to process variations...
This paper proposes a novel self-healing methodology for embedded RF Amplifiers (LNAs) in RF sub-systems. The proposed methodology is based on oscillation principles in which the Device-under-Test (DUT) itself generates the output test signature with the help of additional circuitry. The self-generated test signature from the DUT is analyzed by using onchip resources for testing the LNA and controlling...
In production testing of wireless systems, measurement of EVM (a critical spec that is directly related to bit error rate) incurs significant test time due to the large numbers of symbols that need to be transmitted for reasons of accuracy. In our approach, EVM is modeled as a function of the system static non-idealities (IQ mismatch, gain, IIP3 parameters) and dynamic non-idealities (system noise,...
In many DSP applications (image and voice processing, baseband symbol decoding in high quality communication channels) several dBs of SNR loss can be tolerated without noticeable impact on system level performance. For power optimization in such applications, voltage overscaling can be used to operate the arithmetic circuitry slower than the critical circuit path delay while incurring tolerable SNR...
Polar radio architectures are gaining in popularity due to the promise of an all digital implementations in future CMOS systems-on-chip (SoCs) solutions. Test cost is an important consideration for manufacturers developing these complex devices. Phase noise is an important specification in all digital polar radios as it affects the signal modulation quality. In this paper, a low cost test technique...
Modern wireless transceiver systems are designed to operate under worst case channel operating conditions (interference, adjacent channel power, multi-path effects). This results in very tight performance specifications for the front- end RF circuit components. In this paper, we develop an adaptive power management strategy for RF systems that delivers just enough power (and performance) to the RF...
Defect-based RF testing is a strong candidate for providing the best solution in terms of ATE complexity and cost. However, specification-based testing is still the norm for analog/RF because of the limitations of analog fault models. Unfortunately, as the amount of functionality packed into individual devices is increased with each generation, the cost of testing larger numbers of specifications...
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