Search results for: M.A. Breuer
IEEE Transactions on Reliability > 2008 > 57 > 1 > 204 - 214
IEEE Design & Test of Computers > 2008 > 25 > 2 > 168 - 177
IEEE Design & Test of Computers > 2008 > 25 > 6 > 608 - 609
IEEE Transactions on Computers > 2007 > 56 > 5 > 650 - 661
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 1998 > 6 > 3 > 420 - 431