Search results for: G. Gasiot
Microelectronics Reliability > 2015 > 55 > 9-10 > 1506-1511
Microelectronics Reliability > 2014 > 54 > 8 > 1455-1476
2013 IEEE International Reliability Physics Symposium (IRPS) > 3D.4.1 - 3D.4.8
2012 IEEE International Reliability Physics Symposium (IRPS) > 3C.5.1 - 3C.5.9
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 1086 - 1092
IEEE Transactions on Nuclear Science > 2009 > 56 > 4-2 > 2258 - 2266
IEEE Transactions on Nuclear Science > 2007 > 54 > 4-2 > 1002 - 1009