Search results for: T. N. Goh
Quality and Reliability Engineering International > 33 > 5 > 1143 - 1147
Quality and Reliability Engineering International > 32 > 5 > 1621 - 1626
Quality and Reliability Engineering International > 30 > 8 > 1389 - 1392
Quality and Reliability Engineering International > 30 > 8 > 1191 - 1195
Quality and Reliability Engineering International > 28 > 8 > 943 - 948
Quality and Reliability Engineering International > 27 > 2 > 221 - 227
Quality and Reliability Engineering International > 26 > 5 > 487 - 494
Quality and Reliability Engineering International > 26 > 4 > 351 - 363
Quality and Reliability Engineering International > 26 > 4 > 365 - 373
Quality and Reliability Engineering International > 26 > 6 > 529 - 539
Empirical Software Engineering > 2009 > 14 > 6 > 603-643
Microelectronics Reliability > 1997 > 37 > 4 > 696
Joint Automatic Control Conference > 1974 > 12 > 351 - 353