Search results for: A Leyk
IEEE Journal of Solid-State Circuits > 2008 > 43 > 1 > 236 - 245
Ultramicroscopy > 1998 > 71 > 1-4 > 99-105
Microelectronics Reliability > 1997 > 37 > 10-11 > 1575-1578
01995 00025th European Microwave Conference > 1995 > 2 > 1265 - 1269
01994 00024th European Microwave Conference > 1994 > 2 > 1495 - 1500