Search results for: V. Huard
2011 International Electron Devices Meeting > 27.5.1 - 27.5.4
Microelectronics Reliability > 2011 > 51 > 9-11 > 1425-1439
Microelectronic Engineering > 2011 > 88 > 7 > 1396-1407
2011 International Reliability Physics Symposium > CR.3.1 - CR.3.2
2011 International Reliability Physics Symposium > XT.5.1 - XT.5.3
2011 International Reliability Physics Symposium > 4E.5.1 - 4E.5.5
2011 International Reliability Physics Symposium > GD.3.1 - GD.3.4
2011 International Reliability Physics Symposium > 5A.5.1 - 5A.5.7
IEEE Transactions on Electron Devices > 2010 > 57 > 9 > 2320 - 2323