Search results for: C.H. Tung
Analytica Chimica Acta > 2013 > 775 > Complete > 93-99
IEEE Electron Device Letters > 2008 > 29 > 6 > 595 - 598
2007 IEEE International Electron Devices Meeting > 497 - 500
2007 IEEE Nuclear Science Symposium Conference Record > 6 > 4415 - 4418
Microelectronic Engineering > 2007 > 84 > 9-10 > 1960-1963
Microelectronics Reliability > 2007 > 47 > 2-3 > 429-433