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As integrated circuits become smaller and more complex, it has become increasingly difficult to simulate their responses to radiation. The distance and time scales of relevance extend over orders of magnitude, requiring a multi-scale, hierarchical simulation approach. This paper demonstrates the use of multi-scale simulations to examine two radiation-related problems: enhanced low-dose-rate sensitivity...
Experimental thermal neutron and alpha soft error test results of a 4 Mbit SRAM fabricated on a 0.25 mum process are evaluated using Vanderbilt University's RADSAFE toolkit. The capabilities of the radiation transport code are demonstrated by accurately reproducing experimental results and predicting operational soft error rates for the memory.
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