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This paper presents a built-in self-test (BIST) approach for testing configurable logic and memory resources in Xilinx Virtex FPGAs using hard-macro. The resources under test include the configurable logic blocks (CLBs) and block random access memories (BRAMs) in all of their modes of operation. The proposed approach completely detects and diagnoses single and multiple stuck-at gate-level faults of...
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