Search results for: S. Chen
2015 IEEE International Reliability Physics Symposium > 3C.2.1 - 3C.2.5
IEEE Transactions on Reliability > 2012 > 61 > 2 > 314 - 322
2011 International Reliability Physics Symposium > 6B.3.1 - 6B.3.5
2010 International Electron Devices Meeting > 33.5.1 - 33.5.4
2010 International Electron Devices Meeting > 27.1.1 - 27.1.4
Journal of Electronic Materials > 2007 > 36 > 1 > 6-16