Search results for: F. Campabadal
Microelectronic Engineering > 2015 > 147 > C > 85-88
Solid-State Electronics > 2015 > 111 > C > 47-51
Microelectronics Reliability > 2015 > 55 > 9-10 > 1442-1445
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 769 - 771
Nuclear Inst. and Methods in Physics Research, A > 2013 > 730 > Complete > 91-94
Solid State Electronics > 2013 > 89 > Complete > 198-206
Microelectronic Engineering > 2013 > 109 > Complete > 57-59
Microelectronics Reliability > 2013 > 53 > 9-11 > 1346-1350
Microelectronics Reliability > 2013 > 53 > 9-11 > 1333-1337
Thin Solid Films > 2013 > 534 > Complete > 482-487
2013 Spanish Conference on Electron Devices > 277 - 280
Solid State Electronics > 2013 > 79 > Complete > 65-74