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The content of this article explains some features of reliability testing with application in the field of power semiconductor devices, with emphasis on accelerated tests. For example presents the evolution of acceleration factor depending on the junction temperature of power semiconductor devices, in our case of power thyristors, using the HTOL model (High Temperature Operating Life — operating mode...
Researchers have isolated several variables that moderate the degrading effects of alarm mistrust on alarm reactions. We examined how alarm duration influences reactions to alarms of varying true alarm rates. In Experiment one, 45 psychology students performed a complex psychomotor task while reacting to an alarm system generating short- and long-duration signals. We predicted that participants would...
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