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The paper presents a new channel allocation method for higher Embedded Deterministic Test (EDT) compression in SoC designs comprising isolated cores. It employs a test data reduction technique, which allows cores to interface with ATE through an optimized number of channels. This feature is subsequently used by a new test scheduling and test access mechanisms devised for both the input and output...
This article presents the design of a fully concurrent dual-band Low Noise Amplifier (LNA) operating in the GSM 0.9GHz & BLUETOOTH 2.4GHz communication standards. The fully concurrent LNA is designed and simulated in CADENCE using 130nm UMC technology. The dual-band LNA has been designed from the system viewpoint to provide a higher gain at the high band in order to compensate the high-band...
Periodic testing of electronic devices on the field during application execution is becoming increasingly important. In addition, some of these applications are embedded and real-time, requiring the system to be operational for extended periods. In such applications, field test must be cleverly interleaved with normal operation, such that the latter is not impacted, while at the same time guaranteeing...
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