Search results for: Chia-Yi Yen
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 161 - 168
IEEE Transactions on Electron Devices > 2010 > 57 > 1 > 119 - 124
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 161 - 168
IEEE Transactions on Electron Devices > 2010 > 57 > 1 > 119 - 124