Search results for: A. Hatzopoulos
2017 IEEE SENSORS > 1 - 3
Microelectronics Reliability > 2017 > 73 > C > 54-59
IEEE Design & Test > 2016 > 33 > 3 > 91 - 102
Microelectronics Journal > 2013 > 44 > 12 > 1077-1083
Microelectronics Journal > 2013 > 44 > 10 > 953-958
Infrared Physics and Technology > 2013 > 56 > Complete > 80-84
Simulation Modelling Practice and Theory > 2011 > 19 > 2 > 638-648
IEEE Transactions on Instrumentation and Measurement > 2011 > 60 > 6 > 2025 - 2038