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Thin films of ZnO have been prepared on glass substrates at different thicknesses by spray pyrolysis technique using 0.2M aqueous solution of zinc acetate. X-ray diffraction reveals that the films are polycrystalline in nature having hexagonal wurtzite type crystal structure. The resistivity at room temperature is of the order 10 −2 Ωcm and decreased as the temperature increased. Films are...
Thin films of bismuth with different thicknesses were produced by thermal evaporation from a molybdenum boat source onto cleaned glass substrates at room temperature. The material has been characterized using X-ray diffraction, electrical and optical measurements. A polycrystalline transition phase was observed. The resistivity was calculated for different film thicknesses and found to vary with thickness...
Zinc telluride thin films of various thicknesses are deposited by vacuum evaporation onto glass substrates at room temperature. The X-ray diffraction technique is used to determine the crystalline structure and grain size of the films, respectively. The structure was found to be cubic with preferential orientation along a (111) plane and crystallite size of about 50-80nm. The degree of preferred orientation...
Two zinc oxide samples with different film thicknesses have been thermally evaporated on unheated glass substrate using ZnO high-purity powder. The films were subjected to post-deposition annealing in air at different temperatures. X-ray diffraction confirmed that the films in the as-deposited as well as after annealing are in the amorphous state. The optical properties were studied by transmittance...
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