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Parametric fault testing of non-linear analog circuits based on a new mathematical transform is presented. The V-Transform acts on the polynomial expansion of the circuit's function. Its main properties are: 1) to make the polynomial coefficients monotonic, 2) to reduce masking of parametric faults due to process variation, and 3) to increase the sensitivity of polynomial coefficients to the circuit...
Parametric fault distinction between those arising from process variation as opposed to manufacturing defects in components of an analog integrated circuit is presented. Such a fault distinction has significance in the correction and calibration of process steps responsible for manufacturing defects, thereby improving manufacturing yield. In this paper, we begin by laying out foundations for high...
The probability for errors to occur in electronic systems is not known in advance, but depends on many factors including influence from the environment where the system operates. In this paper, it is demonstrated that inaccurate estimates of the error probability lead to loss of performance in a well known fault tolerance technique, Roll-back Recovery with checkpointing (RRC). To regain the lost performance,...
Conventional random access scan (RAS) for testing has lower test application time, low power dissipation, and low test data volume compared to standard serial scan chain based design. In this paper, we present two cluster based techniques, namely, serial input random access scan and variable word length random access scan to reduce test application time even further by exploiting the parallelism among...
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