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This paper proposes a digital-to-time converter (DTC)-assisted fractional-N wide-bandwidth all-digital phase-locked loop (ADPLL) with a fine-resolution time-to-digital converter (TDC). The TDC employs a two-channel time-interleaved time-domain register with an implicit adder/subtractor realizing an error-feedback topology. Such an error-feedback unit of a first-order $\Delta \Sigma $ -TDC can be...
A 50-MS/s two-step flash-ΔΣ time-to-digital converter (TDC) using a 2-channel time-interleaved time-domain register with an implicit adder/subtractor demonstrates a 3rd order noise-shaping. The TDC is fabricated in 40-nm CMOS and consumes 1.2 mA from a 1.1 V supply. At frequencies below 1.25 MHz, the TDC error integrates to 103 fsrms, which is equal to an equivalent resolution of 1.6 ps.
A divider-less all digital phase locked loop (ADPLL) with a high frequency resolution is implemented. All blocks excluding digitally controlled oscillator (DCO) and time to digital converter (TDC) are realized in standard digital design which consumes less power. The DCO core adopts an improved source-varactor LC resonant tank to achieve a 20KHz frequency resolution. With the help of an additional...
A Vernier Gate-Ring-Oscillator (GRO) Time to Digital Converter (TDC) is proposed and implemented in 90-nm CMOS process technology. It utilizes two GRO chains as the delay lines. The time resolution is determined by the difference between two delays, so not limited by the process. Moreover, the quantization noise can be first-order shaped by the gated behavior in the oscillators, which further improves...
An all digital phase-locked loop (ADPLL) has been implemented in a 90-nm CMOS process. It uses a phase frequency detector (PFD) connected to two time-to-digital converters (TDC). To save power the TDCs use uneven delay time in the delay line cells. An automatic tuning bank controller selects active bank of the digitally controlled oscillator (DCO), which features three separate tuning banks. The PLL...
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