The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Synchrotron white beam X-ray topography (SWBXT) has been used to characterize 2H-silicon carbide crystals grown by the chemical reduction of methyltrichlorosilane at 1400 o C. The crystals studied had the form of tapered needles around 1mm long with hexagonal cross-sections 0.4mm in diameter. SWBXT images recorded from two different crystals showed their excellent quality, as evidenced by...