Search results for: Yongheng Shang
Microelectronics Reliability > 2017 > 68 > C > 30-38
Journal of Electronic Testing > 2016 > 32 > 3 > 393-397
Microelectronics Journal > 2015 > 46 > 12 Part B > 1453-1458
Measurement > 2015 > 65 > Complete > 220-226
IEEE Transactions on Microwave Theory and Techniques > 2015 > 63 > 2-1 > 403 - 413
Measurement > 2014 > 51 > Complete > 81-90
Measurement > 2013 > 46 > 10 > 3802-3807
Measurement > 2013 > 46 > 1 > 402-410
Acta Astronautica > 2011 > 68 > 1-2 > 149-159