Search results for: Charles J. Vath
Microelectronics Reliability > 2011 > 51 > 1 > 137-147
Microelectronic Engineering > 2008 > 85 > 2 > 440-443
Journal of Materials Science > 2007 > 42 > 2 > 615-623
Thin Solid Films > 2006 > 504 > 1-2 > 397-400
Microelectronics Reliability > 2006 > 46 > 2-4 > 467-475
Materials Letters > 2004 > 58 > 25 > 3096-3101
Thin Solid Films > 2004 > 462-463 > Complete > 339-345
Thin Solid Films > 2004 > 462-463 > Complete > 459-464
Microelectronics Reliability > 2003 > 43 > 6 > 913-923
Materials Research Bulletin > 2003 > 38 > 4 > 637-646
Materials Characterization > 2003 > 50 > 1 > 39-50