Search results for: David L. Lanning
Microelectronics Reliability > 1997 > 37 > 8 > 1278
Microelectronics Reliability > 1997 > 37 > 8 > 1277-1278
The Journal of Systems & Software > 1997 > 36 > 2 > 103-113
The Journal of Systems & Software > 1995 > 29 > 1 > 85-91