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A sine-wave histogram-testing structure for analog-to-digital converters (ADCs) is proposed. The ADC static parameters, i.e., offset error, gain error, and nonlinearity errors, are directly obtained from the sine-wave histogram test. Then, the obtained static parameters are related to the estimation of the degraded signal-to-noise ratio (SNR) value. Therefore, the relationships among these parameters...
An improved histogram testing method for analog-to-digital converters (ADCs) is proposed. The proposed method reveals not only the static performance but also the dynamic ones, such as the effective number of bits (ENOB) with a sinusoidal input signal. Therefore, single histogram testing is performed rather than using both the histogram and spectral methods to reduce the total test cost. The proposed...
This paper presents a reconstructive oscillator based sinusoidal signal generator which can produce both high and low frequency signals by switching the oscillator into different mode. In addition, analog and digital signals can be produced concurrently in both modes. Also, signal amplitude and oscillation frequency can be precisely controlled compared with pure analog signal generator. Except for...
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