Search results for: Ling LI
IEEE Transactions on Reliability > 2016 > 65 > 2 > 582 - 592
IEEE Electron Device Letters > 2015 > 36 > 6 > 609 - 611
Proceedings of the 33rd Chinese Control Conference > 7121 - 7126
2013 IEEE International Reliability Physics Symposium (IRPS) > 5A.6.1 - 5A.6.8
IEEE Transactions on Industrial Electronics > 2013 > 60 > 1 > 291 - 300