Search results for: D. Beckmeier
Microelectronics Reliability > 2016 > 64 > C > 2-12
Microelectronics Reliability > 2016 > 64 > C > 189-193
Thin Solid Films > 2011 > 519 > 22 > 8154-8160
Materials Characterization > 2010 > 61 > 11 > 1054-1060