Search results for: Rui Zhang
IEEE Electron Device Letters > 2016 > 37 > 7 > 831 - 834
IEEE Transactions on Electron Devices > 2014 > 61 > 11 > 3668 - 3675
IEEE Transactions on Electron Devices > 2014 > 61 > 2 > 416 - 422
2013 IEEE International Reliability Physics Symposium (IRPS) > 4C.1.1 - 4C.1.8
IEEE Transactions on Electron Devices > 2012 > 59 > 2 > 335 - 341