Search results for: Kuei-Shu Chang-Liao
Microelectronics Reliability > 2017 > 79 > C > 136-139
Microelectronic Engineering > 2017 > 178 > C > 56-60
Microelectronic Engineering > 2017 > 178 > C > 5-9
IEEE Electron Device Letters > 2017 > 38 > 5 > 544 - 547
Microelectronics Reliability > 2017 > 72 > C > 34-38
2016 IEEE Silicon Nanoelectronics Workshop (SNW) > 106 - 107
IEEE Electron Device Letters > 2016 > 37 > 1 > 12 - 15
IEEE Electron Device Letters > 2015 > 36 > 12 > 1314 - 1317
2015 IEEE International Electron Devices Meeting (IEDM) > 21.3.1 - 21.3.4
Microelectronics Reliability > 2015 > 55 > 11 > 2183-2187
Microelectronic Engineering > 2015 > 147 > C > 5-9
Microelectronic Engineering > 2015 > 147 > C > 201-205
Microelectronic Engineering > 2015 > 147 > C > 67-71
Microelectronics Reliability > 2015 > 55 > 11 > 2178-2182
IEEE Transactions on Electron Devices > 2015 > 62 > 5 > 1405 - 1410
Microelectronic Engineering > 2015 > 138 > Complete > 81-85