Search results for: Pai-Chi Chou
Solid State Electronics > 2012 > 77 > Complete > 31-34
Microelectronics Reliability > 2012 > 52 > 4 > 635-641
IEEE Electron Device Letters > 2011 > 32 > 8 > 1017 - 1019
Microelectronics Reliability > 2010 > 50 > 5 > 639-642