Search results for: J. Pons-Nin
Microelectronics Reliability > 2017 > 76-77 > C > 635-639
Journal of Microelectromechanical Systems > 2015 > 24 > 6 > 1684 - 1686
IEEE Transactions on Circuits and Systems I: Regular Papers > 2010 > 57 > 8 > 1879 - 1890
IEEE Transactions on Circuits and Systems I: Regular Papers > 2008 > 55 > 7 > 2038 - 2050