Search results for: M. Koutsoureli
CAS 2012 (International Semiconductor Conference) > 2 > 281 - 284
Microelectronics Reliability > 2012 > 52 > 9-10 > 2240-2244
Microelectronics Reliability > 2012 > 52 > 9-10 > 2267-2271
Microelectronics Reliability > 2012 > 52 > 9-10 > 2508-2511
Microelectronic Engineering > 2012 > 90 > Complete > 72-75
2011 International Reliability Physics Symposium > 3D.4.1 - 3D.4.7
Microelectronics Reliability > 2010 > 50 > 9-11 > 1615-1620
2010 Asia-Pacific Microwave Conference > 1833 - 1836
2009 IEEE MTT-S International Microwave Symposium Digest > 1653 - 1656
IEEE Transactions on Microwave Theory and Techniques > 2009 > 57 > 12-2 > 3518 - 3524
Microelectronics Reliability > 2008 > 48 > 8-9 > 1241-1244