Search results for: J.L. Autran
Microelectronics Reliability > 2017 > 76-77 > C > 53-57
Microelectronics Reliability > 2017 > 76-77 > C > 719-724
Solid-State Electronics > 2016 > 126 > C > 163-169
Microelectronics Reliability > 2016 > 64 > C > 68-72
Microelectronics Reliability > 2015 > 55 > 9-10 > 1506-1511
Microelectronics Reliability > 2015 > 55 > 9-10 > 1501-1505
Microelectronics Reliability > 2015 > 55 > 9-10 > 1522-1526
Microelectronics Reliability > 2015 > 55 > 9-10 > 2147-2153
Microelectronics Reliability > 2014 > 54 > 9-10 > 2284-2288
Microelectronics Reliability > 2014 > 54 > 9-10 > 2278-2283
Microelectronics Reliability > 2014 > 54 > 8 > 1455-1476
2012 IEEE International Reliability Physics Symposium (IRPS) > 3C.5.1 - 3C.5.9
2012 IEEE International Reliability Physics Symposium (IRPS) > 5B.1.1 - 5B.1.2
Journal of Non-Crystalline Solids > 2011 > 357 > 8-9 > 1884-1887
Journal of Non-Crystalline Solids > 2011 > 357 > 8-9 > 1879-1883
Microelectronic Engineering > 2011 > 88 > 4 > 366-369