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A stress measurement method using SnCu coating on an Alloy 42 substrate sample, which indicated non-linear sin2 Psi diagram for the coating under ordinary X-ray diffraction conditions was investigated. Diffraction profile versus 2thetas diagrams for peak indexes of (312), (501), (213), (600), (323), (541), and (631) obtained using an iso inclination method and a fixed Psi method using CuKalpha radiation...
Drastically different tendencies of whisker initiation have been observed from the same Sn/Cu coating electrodeposited on two different Cu leadframe materials, CUFE and CUCR. After long-term storage at room temperature, no whisker initiation was observed on the coating on CUCR, whereas long whiskers with a maximum length of more than 200 mum were formed on the coating on CUFE. FE-STEM and FE-TEM microstructural...
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